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TPS22917EVM

Name: Texas Instruments TPS22917EVM
Brand: Texas Instruments
SKU: 595-TPS22917EVM
Price: 229.4 DKK
Availability: InStock

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Mouser No:

595-TPS22917EVM

Mfr. No:

TPS22917EVM

Mfr.:

Texas Instruments

Description:

Power Management IC Development Tools TPS22917EVM

Datasheet:

TPS22917EVM Datasheet

More Information

Learn more about Texas Instruments TPS22917EVM

In Stock: 9

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Factory Lead Time:: 12 Weeks Estimated factory production time for quantities greater than shown.

Long lead time reported on this product.

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Pricing (DKK)

Qty.	Unit Price	Ext. Price
	229,40 kr.	229,40 kr.

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Product Attribute	Attribute Value	Select Attribute
Manufacturer:	Texas Instruments
Product Category:	Power Management IC Development Tools
RoHS:	N
Product:	Evaluation Modules
Type:	Load Switch
Input Voltage:	1 V to 5.5 V
Tool Is For Evaluation Of:	TPS22917
Series:	TPS22917
Brand:	Texas Instruments
Output Current:	2 A
Product Type:	Power Management IC Development Tools
Factory Pack Quantity:	1
Subcategory:	Development Tools
Unit Weight:	3,634 g

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Datasheet

TPS22917EVM Datasheet

Compliance Codes

TARIC:: 9030820000
CNHTS:: 8543909000
CAHTS:: 9030820000
USHTS:: 9030820000
KRHTS:: 9030820000
MXHTS:: 9030820100
ECCN:: EAR99

Origin Classifications

Country of Origin:: United States
Assembly Country of Origin:: United States
Country of Diffusion:: Not available

The country is subject to change at the time of shipment.

TPS22917EVM Load Switch Evaluation Module

Texas Instruments TPS22917EVM 5.5V, 2A, 80mΩ On-Resistance Load Switch Evaluation Module allows different input voltage (1.0V to 5.5V) under different loading conditions (0A to 2A) to the TPS22917 load switches. The TPS22917EVM easily and accurately evaluates parameters such as the on-resistance, rise time, and output pull-down resistance. The V_IN and V_OUT connections to the device and the PCB layout routing can handle high continuous currents. This provides a low-resistance pathway into and out of the device under test. Test point connections allow control of the device with user-defined test conditions and enables accurate R_ON measurements.